» » Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 8)
hotellemcasadeicervia.it
ePub 1945 kb. | Fb2 1982 kb. | DJVU: 1470 kb.
Engineering

Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 8) epub ebook

by Bharat Bhushan,Harald Fuchs,Masahiko Tomitori

Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 8) epub ebook

Author: Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Category: Engineering
Language: English
Publisher: Springer; 2008 edition (February 19, 2008)
Pages: 465 pages
ISBN: 3540740791
ISBN13: 978-3540740797
Rating: 4.4
Votes: 100
Other formats: docx rtf rtf txt


The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006.

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications

Scanning Probe Microscopy Techniques.

Scanning Probe Microscopy Techniques. First book summarizing the state-of-the-art of this technique.

Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004.

Start by marking Applied Scanning Probe Methods VIII: Scanning Probe .

Start by marking Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques as Want to Read: Want to Read savin. ant to Read.

Автор: Bhushan Bharat, Fuchs Harald, Hosaka Sumio Название .

This book that predicts the future development for all of scanning probe microscopy (SPM). Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts.

NanoScience and Technology) (No. 8) Hardcover – 19 February 2008. Techniques (Nanoscience And Technology) by Bhushan B. Et.

Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 9783540740797, Applied Scanning Probe Methods Viii: Scanning Probe Microscopy Techniques (Nanoscience And Technology) by Bhushan B. Al, Springer, Hardcover.

Bharat Bhushan, Harald Fuchs. Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004

Bharat Bhushan, Harald Fuchs. Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments.

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

2016-2020 © www.hotellemcasadeicervia.it
All rights reserved